High And Low Temperature Vacuum Magnetic Field Probe Station

Jinzhengmao's high and low temperature vacuum magnetic field probe station is a high-precision test bench that provides high and low temperature, vacuum and magnetic field environments. Many of its designs are dedicated.
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    Product Description:

            Jinzhengmao's high and low temperature vacuum magnetic field probe station is a high-precision test bench that provides high and low temperature, vacuum and magnetic field environments. Many of its designs are dedicated. Therefore, the configuration of the high and low temperature magnetic field probe station is mainly selected and designed according to the needs of users. For example, the required magnetic field value, the size of the uniform area, the size of the uniformity, the size of the sample stage, etc. are all related to the magnetic flux density generated by the magnetic field lines in a certain area; the displacement stage can also be matched with a magnetic fluid seal to achieve two horizontal directions. Dimensional movement and 360-degree rotation of the sample stage; in addition, the probe station is matched with the high-precision bipolar constant current power supply independently developed by our company, so that users can achieve high stability of the magnetic field. Therefore, this type of probe station is mainly designed and optimized according to the customer's usage.

            Jinzhengmao high and low temperature vacuum magnetic field probe station The probe station is equipped with 4 (optional 6 or 8) probe arms with high-precision displacement, and is also equipped with a high-precision electron microscope, which is convenient for the observation and operation of small samples. Probes can be used to test chips, wafers, packaged devices, etc. through DC or low-frequency AC signals, and are widely used in semiconductor industry, MEMS, superconductivity, electronics, ferroelectronics, physics, materials science and biomedicine, etc. field.

    Test Range:

    Magnetic property testing, microwave property testing, DC, RF property testing, MEMS, superconductivity testing, optoelectronic properties of nanocircuits, quantum dots and wires, chip testing in high and low temperature vacuum environments, material testing, Hall testing , electromagnetic transport properties, etc.

    Optional Accessories:

    þ All kinds of DC probes, high frequency probes, active probes, cables

    þCCD or C-MOS video imaging device

    þ Chuck exercise device

    þ Electromagnet System / Superconducting Magnet System

    þ 1Mpa positive pressure system upgrade

    þ Ultra High Temperature Upgrade Option

    þ Ultra High Vacuum Upgrade Option

    þ Various probe fixtures

    þ shielding box

    þ Anti-vibration table

    þ Adapter

    þ silent vacuum pump

    Technical Indicators:

    High And Low Temperature Vacuum Magnetic Field Probe Station

    Model

    T8-EM4

    T8-EM5

    T8-EM7

    Degree Of Vacuum

    Gundam10-8Pa

    Cavity Material

    Non-magnetic stainless steel or aluminum alloy

    Magnetic Field Range

    2000Gs @50mm

    5000Gs@50mm

    1T@50mm

    Magnetic Field Direction

    Horizontal (can be designed in vertical direction according to user requirements)

    Supporting Power Supply

    Bipolar power supply ±50A

    Bipolar power supply ±70A

    Bipolar power supply ±90A

    Power Stability

    50ppmOptional 10ppm

    Cooling Method

    Liquid helium/liquid nitrogen refrigeration/closed cycle refrigerator

    Temperature Range

    5K-325K optional 500K

    Temperature Control Resolution

    0.001K temperature controller related

    Temperature Stability

    Better than 0.1K depends on thermostat

    Temperature Sensor

    silicon diode/PT100/CernoxTM

    Number Of Sensors

    One each for sample stage, radiation shield, and probe arm

    Sample Stage Sizemax

    Φ50mmFlatness≤7μm

    Sample Stage Fixing Method

    Vacuum Silicone Grease/Spring Press

    Sample Stage Material

    Gold-plated oxygen-free copper

    Microscope Stroke

    X, Y plane 2*2inch, precision 1μm, Z axis travel ≥50.8mm

    Gain

    16~100X/20~4000X

    Dimensions Of Vacuum Chamber Observation Window

    1inch

    1.5inch

    2inch

    Window Material

    Fused silica (optional K9, calcium fluoride, etc.)

    Number Of Probe Arms

    2468(optional)

    Probe Arm Travel

    (X-Y-Z) 25mm-25mm-12mm  (can be replaced)

    Displacement Accuracy

    10μm /2μm/1μm/0.7μm(optional)

    Interface Form

    Ordinary vacuum connector/triax connector/BNC/SMA, etc.

    Probe Diameter

    0.51mm

    Tip Diameter

    10μm/5μm/1μm(optional)

    Probe Material

    Tungsten/GGB

    Supply Voltage

    AC220V 50Hz/60Hz

    AC380V 50Hz/60Hz

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