High And Low Temperature Vacuum Probe Station
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Product Description：
Jinzhengmao high and low temperature vacuum probe station can carry out high and low temperature test in vacuum environment (4.2K~500K), can upgrade the loading magnetic field, low temperature radiation shield design, the sample table is made of high purity oxygen-free copper, and the temperature uniformity is better. Well, the temperature sensor uses PT100 or calibrated silicon diodes with good stability and repeatability as the temperature measurement device, supports optical fiber spectral characteristics test, is compatible with high-magnification metallographic microscopes, can be fine-tuned and moved, and the high-frequency characteristics of the device (support frequency up to 67GHz), probe heat sink design, light intensity/wavelength test of LD/LED/PD, automatic flow control, IV/CV characteristic test of materials/devices, etc.
Application range:
Jinzhengmao high and low temperature vacuum probe station is used for chip testing, material testing, Hall testing, electromagnetic transport characteristics, etc. in high and low temperature vacuum environment.
Optional Accessories：
þ Shockproof table
þ Multistage Compression Refrigerator
þ Mechanical pump/molecular pump set/ion pump
þ RF components
þ Various types of frequency vacuum joints
þ All kinds of DC probes, high frequency probes, active probes, cables, etc...
þ Various probe fixtures
þ Chuck exercise device
þ Electromagnet System / Superconducting Magnet System
þ 1Mpa positive pressure system
þ Ultra High Temperature Upgrade Option
þ Ultra High Vacuum Upgrade Option
Technical Indicators：
Model
T81-50
T80-50
Cooling Method
Liquid helium/liquid nitrogen refrigeration
Closed cycle refrigerator
Cavity Material
Non-magnetic stainless steel or aluminum alloy
Degree Of Vacuum
Vacuum Premium Gundam10-8Pa
Dimensions Of Vacuum Chamber Observation Window
2inch（optional）
Temperature Control Range
4.2K-450K
5K-450K
Temperature Control Resolution
0.001KThermostat related
Temperature Stability
0.1K temperature controller related
Cooling Time
40min
Within 150min, depending on the power of the refrigerator
Temperature Sensor
Silicon diodes, PT100 (3, one each on the sample stage and probe arm and radiation shield)
Heating Power
LVDC low voltage DC
Sample Stage Material
Gold-plated oxygen-free copper
Sample Stage Size
Diameter 20-50mm, optional 100mm
Sample Stage Flatness
≤7μm
Sample Stage Fixing Method
Fixed stage (upgradeable to move with stage)
Stage Vibration Level
≤50nm
≤1μm（Three-stage shock absorption）
Number Of Probe Arms
2, 4, 6, 8 optional
Probe Arm Mechanical Accuracy
±12.5mm (upgradeable ±25mm), accuracy 1μm (optional)
Kind Of Probe
Tungsten, beryllium copper, microwave probes (optional GSG probes up to 67GHz)
Probe Regulation
Vacuum bellows external adjustment, manual control
Gain
16~100X/20~4000X
Microscope Stroke
X, Y plane 2*2inch, precision 1μm, Z axis travel ≥50.8mm
Electricity Demand
220V 50-60Hz
